MIM-340 Laser microscope with a long-running object table
A device controlled from a personal computer designed to conduct non-contact non-destructive studies of submicron structures with a nanometer resolution in the field of materials science and determining their location on the scale of the entire material science sample with nanometer accuracy. It is a powerful tool for solving a wide range of problems in electronics, materials science, optical production, metrology, biomedical research.
Optical resolution in the lateral plane (X, Y), nm | 13-100 |
Vertical resolution (Z), nm | 0.1 |
Vertical measuring range (Z) μm | 100 |
Field of view (X, Y), μm | 8–8,000 |
Noise level, nm | 0.06 |
Measurement time, s | 0.3 |
Frame size, pix. | 1,280х1,024 |
Light sources | |
laser, nm | 405 |
white LED | - |
Length of stroke (X - Y - Z), mm | 230x245x71 |
Travel speed, mm / s | 1 |
Positioning accuracy, nm | 100 |
Repeatability, nm | 100 |
Unstraightness of movement, nm | 100 |
Carrying capacity, kg | 15 |
System unit | - Intel Core13 540 (Clarkdale, 3,06 GHz, 4 Mb, LGA 1156) - RAM – DDR32048 Mb (рс-10660) 1333 MHz - HDD: 500 Gb (SATA II) - Video card 1Gb ATI 5550 - Microsoft® Windows Vista® Home Premium Edition |
Monitor (2 pcs) | - Matrix type: TN - Screen: 20” (50.8 cm) 1600х900 - Response time – 5 ms |